Scanning probe microscopes
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The basics of scanning probe microscopy are briefly outlined. The principles of operation of the main types of probe microscopes (scanning tunneling microscope, atomic force microscope, electrostatic force microscope, magnetic force microscope, near-field optical microscope) are considered, which are most widely used in scientific research. For students of the Faculty of Radio Electronics and Automation. It may be useful for specialists developing nanodevices.
Author:
Author:Kazakov Valeriy Dmitrievich
Cover:
Cover:hardcover
Category:
- Category:Computer & Technology
- Category:Science & Math
Dimensions:
Dimensions:21.7x15.5x1 cm
ISBN:
ISBN:978-5-9729-1731-0
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