Fluctuations and noise in electronic solid-state devices
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Fluctuations and noises determine the sensitivity of the receiving and measuring electronic devices. In nanoelectronics, the noises are limited to the minimum size of the element, as well as the density of information recording in magnetic recording devices. According to 1 / F-noise, it is possible to evaluate the quality and predict the reliability of integrated circuits and devices based on them without resorting to long-term and expensive tests, and with such high reliability, which other well-known methods do not give. All these questions, as well as ways of description and physical models of various noise (1 / F-noise, Flycker Noise, etc), as well as methods of measurement and noise reduction are described in this tutorial written on the basis of the course of lectures read by the author in Moscow Institute of Electronic Technology.
For students of senior courses, undergraduates, graduate students, as well as researchers and engineers
For students of senior courses, undergraduates, graduate students, as well as researchers and engineers
Author:
Author:Zhigalsky G.P.
Cover:
Cover:Hard
Category:
- Category:Science & Math
ISBN:
ISBN:978-5-9221-1382-3
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