The functional stability of ultra -large integrated circuits
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The monograph considers the problem of assessing the quality of ultra -large integrated schemes (SBS) Progress in their manufacture is not provided by the methodology for assessing the test results for reliability as high -quality properties. To solve this problem, the concept of "electronic functionality" is introduced and it is proposed to take into account the indicator of its functional stability, which determines the likelihood of a dynamic phenomenon, namely a failure of the output signals of the SBS. The possibility of accelerating thermal tests for the reliability of components of electronic technology, including the limit of the adequacy of the thermodynamic model of Arrenius aging for discrete components, as well as its insignificant reliability in the case of assessing the reliability of the SBS by functional criterion, is critically considered. For the forecast of the resource, a linear regression model is proposed. The book is designed for scientists in the field of development of SBS, designers and testers of the electronic component base and equipment, graduate students and students in this specialization, and may also be interested in a wide range of relevant specialists in other fields of equipment
Author:
Author:Kulikov Igor Valentinovich
Cover:
Cover:Soft
Category:
- Category:Engineering & Transportation
- Category:Reference books
Publication language:
Publication Language:Russian
ISBN:
ISBN:9785732511154
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